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[Offer to Sell]

Thin Film Measurement System
Measurement System for Thin Films on LCD and Wafer is a new-age reasonably priced instrument for measurement of such characteristics of thin films as thickness and optical constants. We can provide 50x50cm sample stage for wafer measurement and one square meter sample stage for LCD measurement. Optionally we provide programmable X-Y stage, motorized Z axis, CCD camera, auto focusing. The measurement range is 100A-50um.The measured spot size is 40/20/10/4 um. Data acquisition time is typically 0.5 sec.
Category: Electronics & Electricals / Components Placement Date: Feb 25, 2005 GMT
Company name: K-MAC, Korea Materials & Analysis Corporation Company type: Service, Other
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State: (Premium Membership required) Country: South Korea Thin Film Measurement System
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Offers list from this company:

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  3. [Sell] Thin Film Measurement System
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